Title: Effect of Thermal Annealing in Bi and Zn Melts on Local Centers in ZnSe
Author: Korotkov, V. A.; Kovalev, L. E.; Bruk, L. I.; Gorea, O. S.; Ketrush, P. I.; Malikova, L. V.
Publication info: Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.,
pp. 505-, MRS - Materials Research Society, 1997
ISBN: 9781558993921 [1558993924]
Catalog key: article.bib-01/ZR000000156690

Tokyo Institute of Technology Library's Article Database: 
http://tdl.libra.titech.ac.jp/journaldocs/recordID/article.bib-01/ZR000000156690


Cambridge Journals Online:
http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8058147&fulltextType=RA&fileId=S1946427400234143